Caplan, S. J., A. J. Bedard, and M. T. Decker, 1990: The 700-500 mb Lapse Rate as an Index of Microburst Probability: An Applic
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Caplan, S. J., A. J. Bedard, and M. T. Decker, 1990: The 700-500 mb Lapse Rate as an Index of Microburst Probability: An Application for Thermodynamic Profilers. J. Appl. Meteor., 29, 680-687, doi: http://dx.doi.org/10.1175/1520-0450(1990)029<0680:TMLRAA>2.0.CO;2.
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